Reliability Wearout Mechanisms In Advanced Cmos Technologies at Meripustak

Reliability Wearout Mechanisms In Advanced Cmos Technologies

Books from same Author: Strong

Books from same Publisher: John Wiley And Sons

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  • General Information  
    Author(s)Strong
    PublisherJohn Wiley And Sons
    ISBN9780471731726
    Pages624
    BindingHardbound
    LanguageEnglish
    Publish YearAugust 2009

    Description

    John Wiley And Sons Reliability Wearout Mechanisms In Advanced Cmos Technologies by Strong

    This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.