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Fundamentals Of Modern Vlsi Devices Second Edition at Meripustak

Fundamentals Of Modern Vlsi Devices Second Edition

Books from same Author: Yuan Taur & Tak H. Ning

Books from same Publisher: CAMBRIDGE INDIA

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    • General Information  
    Author(s)Yuan Taur & Tak H. Ning
    PublisherCAMBRIDGE INDIA
    Edition2nd Edition
    ISBN9781316649794
    BindingPaperback
    LanguageEnglish
    Publish YearJanuary 2016

    Description

    CAMBRIDGE INDIA Fundamentals Of Modern Vlsi Devices Second Edition by Yuan Taur & Tak H. Ning

    Learn the basic properties and designs of modern VLSI devices as well as the factors affecting performance with this thoroughly updated second edition. The first edition has been widely adopted as a standard textbook in microelectronics in many major US universities and worldwide. The internationally renowned authors highlight the intricate interdependencies and subtle trade-offs between various practically important device parameters and provide an in-depth discussion of device scaling and scaling limits of CMOS and bipolar devices. Equations and parameters provided are checked continuously against the reality of silicon data making the book equally useful in practical transistor design and in the classroom. Every chapter has been updated to include the latest developments such as MOSFET scale length theory high-field transport model and SiGe-base bipolar devices.