Description
Taylor & Francis Electron Microscopy and Analysis 1987 Proceedings of the Institute of Physics Electron Microscopy and Analysis Group co 1988 Edition by Misc
These proceedings focus on the physical basis and underlying theory of electron optics and analysis. The theme of the conference was advances in images and analysis with electrons and other focussed probes. Topics covered included conventional electron optics and analysis, secondary ion mass spectroscopy, scanning Auger spectroscopy, x-ray microscopy, acoustic microscopy and lithography.