Track Order   | Customer Support   | Request Book   |
International Order
Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits at Meripustak

Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits

Books from same Author: Manoj Sachdev

Books from same Publisher: Springer India Private Ltd

Related Category: Author List / Publisher List

  • Retail Price: ₹ 599/- [ 3.00% off ]

    Seller Price: ₹ 581

Sold By: T K Pandey      Click for Bulk Order

Offer 1: Get ₹ 111 extra discount on minimum ₹ 500 [Use Code: Bharat]

Offer 2: Get 3.00 % + Flat ₹ 100 discount on shopping of ₹ 1500 [Use Code: IND100]

Offer 3: Get 3.00 % + Flat ₹ 300 discount on shopping of ₹ 5000 [Use Code: MPSTK300]

Free Shipping (for orders above ₹ 499) *T&C apply.

In Stock

Free Shipping Available


Click for International Orders
  • Provide Fastest Delivery
  • 100% Original Guaranteed
    • General Information  
    Author(s)Manoj Sachdev
    PublisherSpringer India Private Ltd
    Edition2nd Edition
    ISBN9788184894295
    Pages350
    BindingPaperback
    LanguageEnglish
    Publish YearJanuary 2010

    Description

    Springer India Private Ltd Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits by Manoj Sachdev